دورية أكاديمية
Reliability enhancement in high-performance MOSFETs by annular transistor design
| العنوان: | Reliability enhancement in high-performance MOSFETs by annular transistor design |
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| المؤلفون: | Mayer, D.C., Lacoe, R.C., King, E.E., Osborn, J.V. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 51(6):3615-3620 Dec, 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2004.839157 |