مؤتمر
VirtualScan: a new compressed scan technology for test cost reduction
| العنوان: | VirtualScan: a new compressed scan technology for test cost reduction |
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| المؤلفون: | Wang, L.-T., Xiaoqing Wen, Furukawa, H., Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai, Abdel-Hafez, K.S., Shianling Wu |
| المصدر: | 2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :916-925 2004 |
| Relation: | Proceedings. International Test Conference 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780385802 9780780385801 |
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| DOI: | 10.1109/TEST.2004.1387356 |