مؤتمر
A little DFT goes a long way when testing multi-Gb/s I/O signals
| العنوان: | A little DFT goes a long way when testing multi-Gb/s I/O signals |
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| المؤلفون: | Sproch, J. |
| المصدر: | 2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :1437 2004 |
| Relation: | Proceedings. International Test Conference 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780385802 9780780385801 |
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| DOI: | 10.1109/TEST.2004.1387445 |