In-situ electromigration studies on Sn-Ag-Cu solder joint by digital image speckle analysis (DISA)

التفاصيل البيبلوغرافية
العنوان: In-situ electromigration studies on Sn-Ag-Cu solder joint by digital image speckle analysis (DISA)
المؤلفون: Luhua Xu, Pang, J.H.L., Xiong, B.S.
المصدر: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971) Electronics packaging technology Electronics Packaging Technology Conference, 2004. EPTC 2004. Proceedings of 6th. :410-413 2004
Relation: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780388216
9780780388215
DOI:10.1109/EPTC.2004.1396643