Effect of stress on interfacial intermetallic compound development of Sn-Ag-Cu lead-free solder joint on Au/Ni/Cu substrate

التفاصيل البيبلوغرافية
العنوان: Effect of stress on interfacial intermetallic compound development of Sn-Ag-Cu lead-free solder joint on Au/Ni/Cu substrate
المؤلفون: Ngoh, S.L., Zhou, W., Pang, H.L., Spowage, A.C., Shi, X.Q.
المصدر: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971) Electronics packaging technology Electronics Packaging Technology Conference, 2004. EPTC 2004. Proceedings of 6th. :414-419 2004
Relation: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780388216
9780780388215
DOI:10.1109/EPTC.2004.1396644