Simulation of warpage considering both thermal and cure induced shrinkage during molding in IC packaging

التفاصيل البيبلوغرافية
العنوان: Simulation of warpage considering both thermal and cure induced shrinkage during molding in IC packaging
المؤلفون: Li-Ching Hong, Sheng-Jye Hwang, Huei-Huang Lee, Durn-Yuan Huang
المصدر: 4th IEEE International Conference on Polymers and Adhesives in Microelectronics and Photonics, 2004. POLYTRONIC 2004. Polymers and Adhesives in Microelectronics and Photonics, 2004. POLYTRONIC 2004. 4th IEEE International Conference on. :78-84 2004
Relation: 4th IEEE International Conference on Polymers and Adhesives in Microelectronics and Photonics, 2004. POLYTRONIC 2004.
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780387449
9780780387447
DOI:10.1109/POLYTR.2004.1402743