مؤتمر
An improved method for i/sub DDT/ testing in the presence of leakage and process variation
| العنوان: | An improved method for i/sub DDT/ testing in the presence of leakage and process variation |
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| المؤلفون: | Ali Chehab, Ayman Kayssi, Anis Nazer, Rafic Makki |
| المصدر: | Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) Current and defect based testing Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on. :11-16 2004 |
| Relation: | Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780389506 9780780389502 |
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| DOI: | 10.1109/DBT.2004.1408946 |