80nm self-aligned complementary I-MOS using double sidewall spacer and elevated drain structure and its applicability to amplifiers with high linearity

التفاصيل البيبلوغرافية
العنوان: 80nm self-aligned complementary I-MOS using double sidewall spacer and elevated drain structure and its applicability to amplifiers with high linearity
المؤلفون: Woo Young Choi, Jae Young Song, Byung Yong Choi, Jong Duk Lee, Young June Park, Byung-Gook Park
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :203-206 2004
Relation: 2004 International Electron Devices Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780386841
9780780386846
DOI:10.1109/IEDM.2004.1419108