مؤتمر
Large scale integration and reliability consideration of triple gate transistors
| العنوان: | Large scale integration and reliability consideration of triple gate transistors |
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| المؤلفون: | Choi, J.A., Kwon Lee, You Seung Jin, Yong Jun Lee, Soo Yong Lee, Geon Ung Lee, Seung Hwan Lee, Min Chul Sun, Dong Chan Kim, Young Mi Lee, Su Gon Bae, Jeong Hwan Yang, Maeda, S., Nae In Lee, Ho Kyu Kang, Kwang Pyuk Suh |
| المصدر: | IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :647-650 2004 |
| Relation: | 2004 International Electron Devices Meeting |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780386841 9780780386846 |
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| DOI: | 10.1109/IEDM.2004.1419249 |