Universal signature of ballistic transport in nanoscale field effect transistors

التفاصيل البيبلوغرافية
العنوان: Universal signature of ballistic transport in nanoscale field effect transistors
المؤلفون: Schliemann, A., Worschech, L., Forchel, A., Curatola, G., Iannaccone, G.
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :1039-1042 2004
Relation: 2004 International Electron Devices Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780386841
9780780386846
DOI:10.1109/IEDM.2004.1419368