مؤتمر
Nanocharacterization of a novel copper-membrane and functionalized insulator-semiconductor by atomic force microscopy
| العنوان: | Nanocharacterization of a novel copper-membrane and functionalized insulator-semiconductor by atomic force microscopy |
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| المؤلفون: | Marques de Oliveira, I.A., Pla, M., Escriche, L., Casabo, J., Zine, N., Bausells, J., Bessueille, F., Samitier, J., Errachid, A. |
| المصدر: | Proceedings of IEEE Sensors, 2004. IEEE sensors 2004 Sensors, 2004. Proceedings of IEEE. :726-729 vol.2 2004 |
| Relation: | Proceedings of the IEEE Sensors 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780386922 9780780386921 |
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| DOI: | 10.1109/ICSENS.2004.1426270 |