مؤتمر
Visual inspection of textile surfaces with translation invariant wavelet shrinkage
العنوان: | Visual inspection of textile surfaces with translation invariant wavelet shrinkage |
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المؤلفون: | Fujiwara, H., Zhong Zhang, Hatta, H., Koshimizu, H. |
المصدر: | 30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004 Industrial Electronics Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE. 2:1252-1257 Vol. 2 2004 |
Relation: | IECON 2004 - 30th Annual Conference of IEEE Industrial Electronics Society |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780387309 9780780387300 |
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DOI: | 10.1109/IECON.2004.1431755 |