مؤتمر
Analysis of negative differential resistance (NDR) characteristics induced by self-heating effects in power Si/SiGe/Si double heterojunction bipolar transistors (DHBTs)
| العنوان: | Analysis of negative differential resistance (NDR) characteristics induced by self-heating effects in power Si/SiGe/Si double heterojunction bipolar transistors (DHBTs) |
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| المؤلفون: | Zhang Wan-rong, Zhu Lian-cang, Yang Jing-wei, Liu Hai-jiang, He Yan, Gao Feno-ying, Liu Li-ming, Wang Zhe, Qiu Jian-jun, Gao Pan |
| المصدر: | Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. Solid-state and integrated circuits technology Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on. 3:2155-2158 vol.3 2004 |
| Relation: | 2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 078038511X 9780780385115 |
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| DOI: | 10.1109/ICSICT.2004.1435270 |