مؤتمر
Yield enhancement through fast statistical scan test analysis for digital logic
| العنوان: | Yield enhancement through fast statistical scan test analysis for digital logic |
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| المؤلفون: | Erb, H., Burmer, C., Leininger, A. |
| المصدر: | IEEE/SEMI Conference and Workshop on Advanced Semiconductor Manufacturing 2005. Advanced Semiconductor Manufacturing Conference and Workshop, 2005 IEEE/SEMI. :250-255 2005 |
| Relation: | IEEE/SEMI Conference and Workshop on Advanced Semiconductor Manufacturing 2005. |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780389972 9780780389977 |
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| تدمد: | 10788743 23766697 |
| DOI: | 10.1109/ASMC.2005.1438804 |