مؤتمر
On-chip spectrum analyzer for analog built-in self test
| العنوان: | On-chip spectrum analyzer for analog built-in self test |
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| المؤلفون: | Jose, A.P., Jenkins, K.A., Reynolds, S.K. |
| المصدر: | 23rd IEEE VLSI Test Symposium (VTS'05) VLSI test symposium VLSI Test Symposium, 2005. Proceedings. 23rd IEEE. :131-136 2005 |
| Relation: | Proceedings. 23rd IEEE VLSI Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769523145 9780769523149 |
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| تدمد: | 10930167 23751053 |
| DOI: | 10.1109/VTS.2005.63 |