مؤتمر
A novel mobility-variation-free extraction technique of capacitance coupling coefficient for stacked flash memory cell
| العنوان: | A novel mobility-variation-free extraction technique of capacitance coupling coefficient for stacked flash memory cell |
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| المؤلفون: | Okagaki, T., Tanizawa, M., Fujinaga, M., Kunikiyo, T., Yuki, H., Ishikawa, K., Nishikawa, Y., Eimori, T., Inuishi, M., Oji, Y. |
| المصدر: | Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :219-222 2005 |
| Relation: | ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780388550 9780780388550 |
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| تدمد: | 10719032 21581029 |
| DOI: | 10.1109/ICMTS.2005.1452270 |