Biasing techniques for subthreshold MOS resistive grids

التفاصيل البيبلوغرافية
العنوان: Biasing techniques for subthreshold MOS resistive grids
المؤلفون: Keng Hoong Wee, Ji-jon Sit, Sarpeshkar, R.
المصدر: 2005 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 2005 IEEE International Symposium on. :2164-2167 Vol. 3 2005
Relation: 2005 IEEE International Symposium on Circuits and Systems (ISCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780388348
9780780388345
تدمد:02714302
21581525
DOI:10.1109/ISCAS.2005.1465049