مؤتمر
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation
| العنوان: | Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation |
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| المؤلفون: | Doi, Y., Kajihara, S., Xiaoqing Wen, Li, L., Chakrabarty, K. |
| المصدر: | Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. Design automation conference Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific. 1:59-64 Vol. 1 2005 |
| Relation: | Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780387368 9780780387362 |
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| تدمد: | 21536961 2153697X |
| DOI: | 10.1109/ASPDAC.2005.1466130 |