مؤتمر
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation
العنوان: | Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation |
---|---|
المؤلفون: | Doi, Y., Kajihara, S., Xiaoqing Wen, Li, L., Chakrabarty, K. |
المصدر: | Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. Design automation conference Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific. 1:59-64 Vol. 1 2005 |
Relation: | Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!