دورية أكاديمية
The use of multiple internal reflection on extrinsic silicon infrared detection
| العنوان: | The use of multiple internal reflection on extrinsic silicon infrared detection |
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| المؤلفون: | Shang-Bin Ko, Henderson, H.T. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 27(1):62-65 Jan, 1980 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/T-ED.1980.19820 |