دورية أكاديمية
The use of charge pumping to characterize generation by interface traps
| العنوان: | The use of charge pumping to characterize generation by interface traps |
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| المؤلفون: | Wachnik, R.A. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 33(7):1054-1061 Jul, 1986 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/T-ED.1986.22612 |