Influence of buffer structures on static and dynamic ruggedness of high voltage FWDs

التفاصيل البيبلوغرافية
العنوان: Influence of buffer structures on static and dynamic ruggedness of high voltage FWDs
المؤلفون: Heinze, B., Felsl, H.P., Mauder, A., Schulze, H.J., Lutz, J.
المصدر: Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. Power semiconductor devices & ICs Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on. :215-218 2005
Relation: Proceedings of the 17th International Symposium on Power Semiconductor Devices & ICs
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780388909
9780780388901
تدمد:10636854
19460201
DOI:10.1109/ISPSD.2005.1487989