مؤتمر
Measurement technique for the extraction of differential S-parameters from single-ended S-parameters
| العنوان: | Measurement technique for the extraction of differential S-parameters from single-ended S-parameters |
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| المؤلفون: | Vaz, K., Caggiano, M. |
| المصدر: | 27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Electronics technology Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. 27th International Spring Seminar on. 2:313-317 vol.2 2004 |
| Relation: | 27th International Spring Seminar on Electronics Technology |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780384229 9780780384224 |
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| DOI: | 10.1109/ISSE.2004.1490442 |