دورية أكاديمية
Simulation of heavily irradiated silicon pixel sensors and comparison with test beam measurements
| العنوان: | Simulation of heavily irradiated silicon pixel sensors and comparison with test beam measurements |
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| المؤلفون: | Chiochia, V., Swartz, M., Bortoletto, D., Cremaldi, L., Cucciarelli, S., Dorokhov, A., Hormann, C., Dongwook Kim, Konecki, M., Kotlinski, D., Prokofiev, K., Regenfus, C., Rohe, T., Sanders, D.A., Son, S., Speer, T. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 52(4):1067-1075 Aug, 2005 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2005.852748 |