مؤتمر
DFT techniques for memory macro with built-in ECC
| العنوان: | DFT techniques for memory macro with built-in ECC |
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| المؤلفون: | Kushida, K., Otsuka, N., Hirabayashi, O., Takeyama, T. |
| المصدر: | 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) Workshop on memory technology, design and testing Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on. :109-114 2005 |
| Relation: | 2005 IEEE International Workshop on Memory Technology, Design and Testing |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769523137 9780769523132 |
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| تدمد: | 10874852 |
| DOI: | 10.1109/MTDT.2005.19 |