مؤتمر
Stress induced leakage current dependence on oxide thickness, technology and stress level
| العنوان: | Stress induced leakage current dependence on oxide thickness, technology and stress level |
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| المؤلفون: | Scarpa, A., Ries, P., Ghibaudo, G., Paccagnella, A., Pananakakis, G., Brini, J., Ghidini, G., Papadas, C. |
| المصدر: | 27th European Solid-State Device Research Conference Solid-State Device Research Conference, 1997. Proceeding of the 27th European. :592-595 1997 |
| Relation: | 27th European Solid-State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 2863322214 9782863322215 |
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| DOI: | 10.1109/ESSDERC.1997.194498 |