مؤتمر
Analysis on the Avalanche Ruggedness of Finger Type and Stripe Type LDMOS Transistor
| العنوان: | Analysis on the Avalanche Ruggedness of Finger Type and Stripe Type LDMOS Transistor |
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| المؤلفون: | Kwon, T.H., Choi, Y.C., Kim, C.J., Kang, H.S., Song, C.S. |
| المصدر: | 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :236-239 2000 |
| Relation: | 30th European Solid-State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 2863322486 9782863322482 |
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| DOI: | 10.1109/ESSDERC.2000.194758 |