مؤتمر
Influence of Doping Profile and Halo Implantation on the Threshold Voltage Mismatch of a 0.13um CMOS Technology
العنوان: | Influence of Doping Profile and Halo Implantation on the Threshold Voltage Mismatch of a 0.13um CMOS Technology |
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المؤلفون: | Croon, J.A., Augendre, E., Decoutere, S., Sansen, W., Maes, H.E. |
المصدر: | 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :579-582 2002 |
Relation: | 32nd European Solid-State Device Research Conference |
قاعدة البيانات: | IEEE Xplore Digital Library |
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