مؤتمر
Performance and Reliability of 70nm NMOSFETs with Indium Retrograde Doping Channels
| العنوان: | Performance and Reliability of 70nm NMOSFETs with Indium Retrograde Doping Channels |
|---|---|
| المؤلفون: | Xiang, Q., Martin, D., Yu, B., Yeap, G.C.-F., Lin, M.-R. |
| المصدر: | 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:564-567 1999 |
| Relation: | 29th European Solid-State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 2863322451 9782863322451 |
|---|