مؤتمر
Automatic Time Domain Testing of SAW Devices
| العنوان: | Automatic Time Domain Testing of SAW Devices |
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| المؤلفون: | Langecker, K., Veith, R. |
| المصدر: | 1980 Ultrasonics Symposium. :396-399 1980 |
| Relation: | 1980 Ultrasonics Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| DOI: | 10.1109/ULTSYM.1980.197427 |
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