مؤتمر
Developing a strategic error source based design evaluation for ADC's
العنوان: | Developing a strategic error source based design evaluation for ADC's |
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المؤلفون: | Hannon, J., Wegener, C., Kennedy, M.P. |
المصدر: | Research in Microelectronics and Electronics, 2005 PhD Microelectronics and Electronics Research in Microelectronics and Electronics, 2005 PhD. 1:74-77 vol.1 2005 |
Relation: | 2005 PhD Research in Microelectronics and Electronics |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780393457 9780780393455 |
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DOI: | 10.1109/RME.2005.1543006 |