مؤتمر
MOS gate current characteristics and their implications for lifetime area scaling
| العنوان: | MOS gate current characteristics and their implications for lifetime area scaling |
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| المؤلفون: | Kleff, S., Bottini, R., Ghidini, G. |
| المصدر: | Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :391-394 2005 |
| Relation: | Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780392035 9780780392038 |
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| تدمد: | 19308876 23786558 |
| DOI: | 10.1109/ESSDER.2005.1546667 |