مؤتمر
A possibility test on a discrimination system for identification of cultivated products by trace elements analysis
العنوان: | A possibility test on a discrimination system for identification of cultivated products by trace elements analysis |
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المؤلفون: | Sato, N., Uehara, M., Tamaoka, J., Shimomura, K., Yamamoto, H., Kamijo, K. |
المصدر: | The Fifth International Conference on Computer and Information Technology (CIT'05) Computer and Information Technology Computer and Information Technology, 2005. CIT 2005. The Fifth International Conference on. :971-975 2005 |
Relation: | The Fifth International Conference on Computer and Information Technology CIT 2005 |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 076952432X 9780769524320 |
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DOI: | 10.1109/CIT.2005.36 |