مؤتمر
Process variability characterization and interconnect modeling
العنوان: | Process variability characterization and interconnect modeling |
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المؤلفون: | Hong-Ha Vuong, Yuhua Cheng |
المصدر: | Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. Custom Integrated Circuits Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005. :586-587 2005 |
Relation: | Proceedings of the IEEE 2005 Custom Integrated Circuits Conference |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780390237 9780780390232 |
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تدمد: | 08865930 21523630 |
DOI: | 10.1109/CICC.2005.1568737 |