مؤتمر
Process variability characterization and interconnect modeling
| العنوان: | Process variability characterization and interconnect modeling |
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| المؤلفون: | Hong-Ha Vuong, Yuhua Cheng |
| المصدر: | Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. Custom Integrated Circuits Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005. :586-587 2005 |
| Relation: | Proceedings of the IEEE 2005 Custom Integrated Circuits Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780390237 9780780390232 |
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| تدمد: | 08865930 21523630 |
| DOI: | 10.1109/CICC.2005.1568737 |