مؤتمر
Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K
| العنوان: | Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K |
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| المؤلفون: | Derkach, V.N., Golovashehenko, R.V., Nedukh, S.V., Plevako, A.S., Tarapov, S.I. |
| المصدر: | 2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics Infrared and Millimeter Waves Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on. 1:192-193 vol. 1 2005 |
| Relation: | The Joint 30th International Conference on Infrared and Millimeter Waves |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780393481 9780780393486 |
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| تدمد: | 21622027 21622035 |
| DOI: | 10.1109/ICIMW.2005.1572473 |