مؤتمر
A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture
| العنوان: | A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture |
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| المؤلفون: | Shinogi, T., Yamada, H., Hayashi, T., Tsuruoka, S., Yoshikawa, T. |
| المصدر: | 14th Asian Test Symposium (ATS'05) Test Symposium, 2005. Proceedings. 14th Asian. :366-371 2005 |
| Relation: | 2005 14th Asian Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769524818 9780769524818 |
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| تدمد: | 10817735 23775386 |
| DOI: | 10.1109/ATS.2005.17 |