مؤتمر
Non-uniform degradation behavior across device width in RF power GaAs PHEMTs
| العنوان: | Non-uniform degradation behavior across device width in RF power GaAs PHEMTs |
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| المؤلفون: | Villanueva, A.A., del Alamo, J.A., Hisaka, T., Hayashi, K., Somerville, M. |
| المصدر: | IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :783-786 2005 |
| Relation: | International Electron Devices Meeting 2005 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 078039268X 9780780392687 |
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| تدمد: | 01631918 2156017X |
| DOI: | 10.1109/IEDM.2005.1609471 |