مؤتمر
Investigation of lateral charge distribution of 2-bit SONOS memory devices using physically separated twin SONOS structure
| العنوان: | Investigation of lateral charge distribution of 2-bit SONOS memory devices using physically separated twin SONOS structure |
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| المؤلفون: | Byung Yong Choi, Choong-Ho Lee, Yong Kyu Lee, Hyungcheol Shin, Jong Duk Lee, Byung-Gook Park, Dong-Won Kim, Suk-Kang Sung, Se Hoon Lee, Byung-Kyu Cho, Tae-Yong Kim, Eun Suk Cho, Jong Jin Lee, Donggun Park |
| المصدر: | 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :47-50 2006 |
| Relation: | Proceedings of the 2006 International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1424401674 9781424401673 |
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| تدمد: | 10719032 21581029 |
| DOI: | 10.1109/ICMTS.2006.1614273 |