دورية أكاديمية
Investigation of short-circuit failure limited by dynamic-avalanche capability in 600-V punchthrough IGBTs
| العنوان: | Investigation of short-circuit failure limited by dynamic-avalanche capability in 600-V punchthrough IGBTs |
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| المؤلفون: | Kwang-Hoon Oh, Young Chul Kim, Kyu Hyun Lee, Chong Man Yun |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 6(1):2-8 Mar, 2006 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2006.870338 |