مؤتمر
Enhanced switching reliability of a non-volatile phase-change memory device with an oxidized TiN electrode
| العنوان: | Enhanced switching reliability of a non-volatile phase-change memory device with an oxidized TiN electrode |
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| المؤلفون: | Dae-Hwan Kang, In Ho Kim, Jeung-hyun Jeong, Byung-ki Cheong, Dong-Ho Ahn, Ki-Bum Kim |
| المصدر: | 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st. :90-91 2006 |
| Relation: | 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1424400279 9781424400270 |
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| تدمد: | 2159483X 21594864 |
| DOI: | 10.1109/.2006.1629508 |