Feature extraction and damage-precursors for prognostication of lead-free electronics

التفاصيل البيبلوغرافية
العنوان: Feature extraction and damage-precursors for prognostication of lead-free electronics
المؤلفون: Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Suhling, J., Lee, J.
المصدر: 56th Electronic Components and Technology Conference 2006 Electronic Components & Technology Electronic Components and Technology Conference, 2006. Proceedings. 56th. :10 pp. 2006
Relation: 2006 Proceedings. 56th Electronic Components & Technology Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:1424401526
9781424401529
تدمد:05695503
23775726
DOI:10.1109/ECTC.2006.1645736