دورية أكاديمية
Mechanism of Dynamic Bias Temperature Instability in p- and nMOSFETs: The Effect of Pulse Waveform
| العنوان: | Mechanism of Dynamic Bias Temperature Instability in p- and nMOSFETs: The Effect of Pulse Waveform |
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| المؤلفون: | Zhu, S., Nakajima, A., Ohashi, T., Miyake, H. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(8):1805-1814 Aug, 2006 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2006.877876 |