مؤتمر
A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs
| العنوان: | A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs |
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| المؤلفون: | Petrescu, V., Pelgrom, M., Veendrick, H., Pavithran, P., Wieling, J. |
| المصدر: | 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :2220-2229 2006 |
| Relation: | 2006 IEEE International Solid State Circuits Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1424400791 9781424400799 |
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| تدمد: | 01936530 23768606 |
| DOI: | 10.1109/ISSCC.2006.1696283 |