مؤتمر
Probabilistic Testability Measure Before Pseudorandom Test Generation
| العنوان: | Probabilistic Testability Measure Before Pseudorandom Test Generation |
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| المؤلفون: | Kaminska, M.O., Kulak, E.N., Guz, O.A., Yeliseev, V.V. |
| المصدر: | Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference. :591-594 2006 |
| Relation: | Proceedings of the International Conference Mixed Design of Integrated Circuits and System |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 8392263227 9788392263227 |
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| DOI: | 10.1109/MIXDES.2006.1706649 |