مؤتمر
A new development of failure bound method-diagnosable conditions with application for analog systems
| العنوان: | A new development of failure bound method-diagnosable conditions with application for analog systems |
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| المؤلفون: | Shi Ying Zhou, Zheng Hui Lin |
| المصدر: | China., 1991 International Conference on Circuits and Systems Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on. :486-488 vol.2 1991 |
| Relation: | China., 1991 International Conference on Circuits and Systems |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| DOI: | 10.1109/CICCAS.1991.184396 |
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