مؤتمر
Reliability assessment of high-leadcount TAB package
| العنوان: | Reliability assessment of high-leadcount TAB package |
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| المؤلفون: | Ling, J., Teoh, H., Sorrells, D., Jones, J. |
| المصدر: | 1992 Proceedings 42nd Electronic Components & Technology Conference Electronic Components and Technology Conference, 1992. Proceedings., 42nd. :957-967 1992 |
| Relation: | 1992 42nd Electronic Components & Technology Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780301676 9780780301672 |
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| DOI: | 10.1109/ECTC.1992.204321 |