مؤتمر
Test input vectors for supply current testing of TTL combinational circuits
| العنوان: | Test input vectors for supply current testing of TTL combinational circuits |
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| المؤلفون: | Hashizume, M., Tamesada, T., Tsukimoto, I. |
| المصدر: | Proceedings First Asian Test Symposium (ATS `92) Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0). :58-63 1992 |
| Relation: | Proceedings First Asian Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818629851 9780818629853 |
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| DOI: | 10.1109/ATS.1992.224436 |