مؤتمر
Interconnect testing using BIST embedded in IEEE 1149.1 designs
| العنوان: | Interconnect testing using BIST embedded in IEEE 1149.1 designs |
|---|---|
| المؤلفون: | Koeter, J., Sparks, S. |
| المصدر: | [1991] Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International. :P11-2/1 1991 |
| Relation: | Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780301013 9780780301016 |
|---|---|
| DOI: | 10.1109/ASIC.1991.242914 |