مؤتمر
A test function architecture for interconnected finite state machines
| العنوان: | A test function architecture for interconnected finite state machines |
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| المؤلفون: | Kanjilal, S., Chakradhar, S.T., Agrawal, V.D. |
| المصدر: | Proceedings of 7th International Conference on VLSI Design VLSI Design, 1994., Proceedings of the Seventh International Conference on. :113-116 1994 |
| Relation: | Proceedings of 7th International Conference on VLSI Design |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818649909 9780818649905 |
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| تدمد: | 10639667 |
| DOI: | 10.1109/ICVD.1994.282667 |