مؤتمر
A test function architecture for interconnected finite state machines
العنوان: | A test function architecture for interconnected finite state machines |
---|---|
المؤلفون: | Kanjilal, S., Chakradhar, S.T., Agrawal, V.D. |
المصدر: | Proceedings of 7th International Conference on VLSI Design VLSI Design, 1994., Proceedings of the Seventh International Conference on. :113-116 1994 |
Relation: | Proceedings of 7th International Conference on VLSI Design |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0818649909 9780818649905 |
---|---|
تدمد: | 10639667 |
DOI: | 10.1109/ICVD.1994.282667 |