Beam tests of a high resolution silicon vertex detector system with VLSI readout

التفاصيل البيبلوغرافية
العنوان: Beam tests of a high resolution silicon vertex detector system with VLSI readout
المؤلفون: Russ, J., Clemen, M., Edelstein, R., Potter, D., Procario, M., Timm, S., Yang, S., Zhang, C., Newsom, C.R.
المصدر: IEEE Conference on Nuclear Science Symposium and Medical Imaging Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE. :178-180 vol.1 1992
Relation: 1992 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC'92)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780308840
9780780308848
DOI:10.1109/NSSMIC.1992.301111